N Strong Films 2014, 552, 24. [32] T. Pagnier, I. Charrier-Cougoulic, C. Ritter, G. Lucazeau, Eur. Phys. J. Appl. Phys. 2000, 9, 1. [33] D. Han, K. Shinoda, S. Sato, M. Majima, T. Uda, J. Mater. Chem. A 2015, three, 1243. [34] E. Chason, J. Yin, K. Tetz, R. Beresford, L. B. Freund, M. U. Gonzalez, J. A. Floro, in Self-Organized Processes in Semiconductor Alloys, Vol. 583 (Eds: D. Follstaedt, B. Joyce, A. Mascarenhas, T. Suzuki), Components Analysis Society, Pittsburgh, USA 2000, pp. 16775. [35] L. B. Freund, S. Suresh, L. B. Freund, S. Suresh, Film Stress and Substrate Curvature, Cambridge University Press, Cambridge, UK 2004.Supporting InformationSupporting Information is accessible from the Wiley On the web Library or in the author.AcknowledgementsThis investigation was supported by the Swiss National Science Foundation (SNSF) under grant agreement no. 200021_126783 and NCCR MARVEL. D.P. gratefully thanks Prof. Enrico Traversa and Dr. Lei Bi for fruitful recommendations and discussion. The authors thank Max D eli with the Laboratory for Ion Beam Physics at ETH Zurich (CH) for the compositional evaluation by Rutherford backscattering and particle induced X-ray emission and Johann Michler, Madoka Hasegawa, and Vipin Chawla in the Laboratory for Mechanics of Supplies and Nanostructures at EMPA, Thun (CH) for UV photolithography of interdigitated microelectrodes.Lofepramine manufacturer Deutsche Forschungsgemeinschaft (DFG) below Grant No. SFB1073, project Z02, is gratefully acknowledged.Conflict of InterestThe authors declare no conflict of interest.Keywordsproton conductor, simulation, strain, thin film, Y-doped BaZrO3 Received: August 9, 2017 Revised: September ten, 2017 Published on the internet: October 27,Adv. Sci. 2017, 4,1700467 (9 of ten)2017 The Authors. Published by WILEY-VCH Verlag GmbH Co. KGaA, Weinheimwww.advancedsciencenews.com [36] U. W. Pohl, Epitaxy of Semiconductors: Introduction to Physical Principles, Springer, Berlin 2013. [37] P. Babilo, T. Uda, S. M. Haile, J. Mater. Res. 2007, 22, 1322. [38] K. D. Kreuer, A. Fuchs, J. Maier, Solid State Ionics 1995, 77, 157. [39] A. S. Nowick, A. V. Vaysleyb, Strong State Ionics 1997, 97, 17. [40] S. Ricote, N. Bonanos, H. J. Wang, B. A. Boukamp, Strong State Ionics 2012, 213, 36. [41] H. G. Bohn, T. Schober, J. Am. Ceram. Soc. 2000, 83, 768. [42] L. Mazzei, M. Wolff, D. Pergolesi, J. A.Chrysin Purity & Documentation Dura, L.PMID:24101108 B jesson, P. Gutfreund, M. Bettinelli, T. Lippert, M. Karlsson, J. Phys. Chem. C 2016, 120, 28415. [43] J. M. Polfus, T. S. Bj heim, T. Norby, R. Bredesen, J. Mater. Chem. A 2016, four, 7437. [44] M. A. Gomez, M. A. Griffin, S. Jindal, K. D. Rule, V. R. Cooper, J. Chem. Phys. 2005, 123, 094703. [45] A. Kushima, B. Yildiz, J. Mater. Chem. 2010, 20, 4809.www.advancedscience.com [46] R. Auto, M. Parrinello, Phys. Rev. Lett. 1985, 55, 2471. [47] M. Fronzi, Y. Tateyama, N. Marzari, M. Nolan, E. Traversa, Mater. Renewable Sustainable Power 2016, five, 14. [48] P. Giannozzi, S. Baroni, N. Bonini, M. Calandra, R. Vehicle, C. Cavazzoni, D. Ceresoli, G. L. Chiarotti, M. Cococcioni, I. Dabo, A. Dal Corso, S. De Gironcoli, S. Fabris, G. Fratesi, R. Gebauer, U. Gerstmann, C. Gougoussis, A. Kokalj, M. Lazzeri, L. Martin-Samos, N. Marzari, F. Mauri, R. Mazzarello, S. Paolini, A. Pasquarello, L. Paulatto, C. Sbraccia, S. Scandolo, G. Sclauzero, A. P. Seitsonen, A. Smogunov, P. Umari, R. M. Wentzcovitch, J. Phys.: Condens. Matter 2009, 21, 395502. [49] I. Castelli, N. Mounet, N. Marzari, Regular Strong State Pseudopotentials, http://Materialscloud.Org/, 2016 (ac.
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